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SIMULTECH 2012 was held in conjunction with ICINCO 2012
Registration to SIMULTECH allows free access to the ICINCO conference (as a non-speaker)


 
The purpose of the 2nd International Conference on Simulation and Modeling Methodologies, Technologies and Applications (SIMULTECH) is to bring together researchers, engineers, applied mathematicians and practitioners interested in the advances and applications in the field of system simulation. Four simultaneous tracks will be held, covering on one side domain independent methodologies and technologies and on the other side practical work developed in specific application areas. The specific topics listed under each of these tracks highlight the interest of this conference in aspects related to computing, including Conceptual Modeling, Agent Based Modeling and Simulation, Interoperability, Ontologies, Knowledge Based Decision Support, Petri Nets, Business Process Modeling and Simulation, amongst others.

Conference Chair

Mohammad S. ObaidatMonmouth University, United States

PROGRAM CO-CHAIRS

Nuno Pina GonçalvesEST-Setúbal / IPS, Portugal
Janusz KacprzykPolish Academy of Sciences, Poland

KEYNOTE LECTURES

David M. NicolUniversity of Illinois, Urbana-Champaign, United States
Tuncer ÖrenUniversity of Ottawa, Canada
Simon TaylorBrunel University, United Kingdom
Anthony John JakemanAustralian National University, Australia
 

A short list of papers presented at the conference will be selected for publication of extended and revised versions in the JDMS

Best papers with clear contributions to
discrete-event simulation will be invited to
submit revised versions to the
Journal of Simulation


A short list of presented papers will be selected so that revised and extended versions of these papers will be published by Springer-Verlag in a Advances in Intelligent and Soft Computing Series book


Technically Co-sponsored by:
SCS   GDR-I3   Liophant Simulation   Simulation Team    IFIP  


In Cooperation with:
AIS SIGMAS   MIMOS  


Proceedings will be submitted for indexation by:
Thomson   INSPEC   DBLP   EI  
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